Electro Static Discharge
Electro Static Discharge, also known as ESD, means the equalization of different electrostatic potentials between two or more objects. It can damage devices by a rapid localized heating of the semiconductor material or by rapidly creating strong electrical fields. Critically, even very small discharges or over-stress can be fatal or cause latent failures. There are multiple methods to test for electrostatic discharge, for example, human body model (HBM), machine model (MM), charged device model (CDM), socketed device model (SDM), etc.. Among them, human body model testing is the principle test requirement for industry, and charged device model is recognized as a high priority for implementation today. Over the decades, a variety of methods have been tested and implemented to mitigate the consequences of ESD. The need to regulate these effects is reflected by the passing of MIL-STD-1686, created by the U.S. Department of Defense aimed at minimizing effects of ESD on parts, assemblies, and equipment through a control program. We are also concerned with MIL-STD-750 and MIL-STD-883, where various test methods and models are defined for semiconductors.